Title :
A Method for Testing Software Systems Based on State Design Pattern Using Symbolic Execution
Author :
Tudose, Cristina ; Opria, Radu
Author_Institution :
Dept. of Comput. Sci. & Math., Univ. of Pitesti, Pitesti, Romania
Abstract :
The paper reports a new testing method working with state pattern designed software systems. The tests are performed in terms of symbolic execution aiming to identify conditions and values of some input parameters that violate assertions at runtime. The state based architecture of such systems allows a direct mapping of the methods to the transitions of the underlying finite state machine (FSM). In order to identify the methods that contain failing assertions, the Java Path Finder Symbolic Execution framework extension (JPF-SE) is used for an out of context execution of each method. We propose a new algorithm to compute a transition path from the initial state of the system to each faulty transition. The computation is carried out using a backward traversal scheme of the FSM support graph where the JPF-SE symbolically executes each transition of the path. The transition execution performed by JPF-SE yields to the backward propagation of the conditions imposed on the input parameters. The overall capabilities of the proposed algorithm are illustrated with an example.
Keywords :
Java; finite state machines; object-oriented programming; program testing; software architecture; software fault tolerance; Java Path Finder Symbolic Execution framework extension; backward propagation; backward traversal scheme; faulty transition; finite state machine; method mapping; runtime assertion violation; software system testing; state based architecture; state design pattern; symbolic execution; transition path; Calculators; Concrete; Context; Java; Runtime; Software systems; Testing; Java PathFinder; finite state machine; software testing; state design pattern; symbolic execution;
Conference_Titel :
Software Engineering and Formal Methods (SEFM), 2010 8th IEEE International Conference on
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-8289-4
DOI :
10.1109/SEFM.2010.20