DocumentCode :
3118120
Title :
Back-annotation of Simulation Traces with Change-Driven Model Transformations
Author :
Hegedüs, Ábel ; Bergmann, Gábor ; Ráth, István ; Varró, Dániel
Author_Institution :
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear :
2010
fDate :
13-18 Sept. 2010
Firstpage :
145
Lastpage :
155
Abstract :
Model-driven analysis aims at detecting design flaws early in high-level design models by automatically deriving mathematical models. These analysis models are subsequently investigated by formal verification and validation (V&V) tools, which may retrieve traces violating a certain requirement. Back-annotation aims at mapping back the results of V&V tools to the design model in order to highlight the real source of the fault, to ease making necessary amendments. Here we propose a technique for the back-annotation of simulation traces based on change-driven model transformations. Simulation traces of analysis models will be persisted as a change model with high-level change commands representing macro steps of a trace. This trace is back-annotated to the design model using change-driven transformation rules, which bridge the conceptual differences between macro steps in the analysis and design traces. Our concepts will be demonstrated on the back-annotation problem for analyzing BPEL processes using a Petri net simulator.
Keywords :
Petri nets; formal verification; specification languages; BPEL process; Petri net simulator; automatically deriving mathematical model; backannotation problem; change driven model transformation; design flaw detection; formal validation tool; formal verification; high level design model; model driven analysis; simulation trace; Analytical models; Biological system modeling; Business; Mathematical model; Petri nets; Semantics; Unified modeling language; back-annotation; change-driven model transformations; simulation traces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering and Formal Methods (SEFM), 2010 8th IEEE International Conference on
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-8289-4
Type :
conf
DOI :
10.1109/SEFM.2010.28
Filename :
5637422
Link To Document :
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