Title :
Power combining port impedance model
Author :
Lee, M.J. ; Faulkner, J.A., Jr.
Author_Institution :
Northrop Grumman Corp., Baltimore, MD, USA
Abstract :
A novel way to characterize the port impedances of broadband combining networks has been developed. The impedance of a coupler port in the environment of a fully driven combiner is analyzed to develop a thorough understanding of the interaction of power MMICs and combiners in actual manufacturing environments.
Keywords :
MMIC power amplifiers; electric impedance; power combiners; broadband combining networks; impedance model; port impedances; power MMICs; power combining port; High power microwave generation; Impedance; Insertion loss; MMICs; Manufacturing; Narrowband; Resistors; Scattering parameters; Solid state circuits; Testing;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.602851
