Title :
Pulse evaluation of high voltage SIC diodes
Author :
Brien, H.O. ; Shaheen, W. ; Bayne, S.B. ; Hull, Brett A. ; Agarwal, A.K.
Author_Institution :
U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD 20783 USA
Abstract :
The U. S. Army Research Laboratory (ARL) is evaluating silicon carbide switches and diodes to determine the range of high power and pulsed power applications for which SiC is a sensible material to use. This study focused on 6 kV, SiC P-i-N diodes which were designed by Cree Inc. and packaged and pulse tested at ARL. Diodes were pulsed at a single shot rate both individually and in parallel. Individual diodes were pulsed as high as 5.9 kA (corresponding to an action of 4.5 × 103 A2s) for 25 single shots before failing, and as high as 5.0 kA (with an action of 3.5×103 A2s) for over 100 shots without failure. Five diodes paralleled in the pulse testbed carried a total current of 23 kA with each diode sharing 19–21% of the total peak current. Eight diodes in parallel reached over 39 kA peak current. The ultimate goal is to combine 8–10 diodes in a single, compact package for higher current applications.
Keywords :
Anodes; Cathodes; Clamps; Laboratories; P-i-n diodes; Packaging; Silicon carbide; Switches; Testing; Voltage;
Conference_Titel :
Pulsed Power Conference, 2007 16th IEEE International
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0913-6
Electronic_ISBN :
978-1-4244-0914-3
DOI :
10.1109/PPPS.2007.4652365