• DocumentCode
    3118502
  • Title

    Pulse evaluation of high voltage SIC diodes

  • Author

    Brien, H.O. ; Shaheen, W. ; Bayne, S.B. ; Hull, Brett A. ; Agarwal, A.K.

  • Author_Institution
    U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD 20783 USA
  • Volume
    2
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1029
  • Lastpage
    1033
  • Abstract
    The U. S. Army Research Laboratory (ARL) is evaluating silicon carbide switches and diodes to determine the range of high power and pulsed power applications for which SiC is a sensible material to use. This study focused on 6 kV, SiC P-i-N diodes which were designed by Cree Inc. and packaged and pulse tested at ARL. Diodes were pulsed at a single shot rate both individually and in parallel. Individual diodes were pulsed as high as 5.9 kA (corresponding to an action of 4.5 × 103 A2s) for 25 single shots before failing, and as high as 5.0 kA (with an action of 3.5×103 A2s) for over 100 shots without failure. Five diodes paralleled in the pulse testbed carried a total current of 23 kA with each diode sharing 19–21% of the total peak current. Eight diodes in parallel reached over 39 kA peak current. The ultimate goal is to combine 8–10 diodes in a single, compact package for higher current applications.
  • Keywords
    Anodes; Cathodes; Clamps; Laboratories; P-i-n diodes; Packaging; Silicon carbide; Switches; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2007 16th IEEE International
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0913-6
  • Electronic_ISBN
    978-1-4244-0914-3
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4652365
  • Filename
    4652365