DocumentCode
3118502
Title
Pulse evaluation of high voltage SIC diodes
Author
Brien, H.O. ; Shaheen, W. ; Bayne, S.B. ; Hull, Brett A. ; Agarwal, A.K.
Author_Institution
U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD 20783 USA
Volume
2
fYear
2007
fDate
17-22 June 2007
Firstpage
1029
Lastpage
1033
Abstract
The U. S. Army Research Laboratory (ARL) is evaluating silicon carbide switches and diodes to determine the range of high power and pulsed power applications for which SiC is a sensible material to use. This study focused on 6 kV, SiC P-i-N diodes which were designed by Cree Inc. and packaged and pulse tested at ARL. Diodes were pulsed at a single shot rate both individually and in parallel. Individual diodes were pulsed as high as 5.9 kA (corresponding to an action of 4.5 × 103 A2s) for 25 single shots before failing, and as high as 5.0 kA (with an action of 3.5×103 A2s) for over 100 shots without failure. Five diodes paralleled in the pulse testbed carried a total current of 23 kA with each diode sharing 19–21% of the total peak current. Eight diodes in parallel reached over 39 kA peak current. The ultimate goal is to combine 8–10 diodes in a single, compact package for higher current applications.
Keywords
Anodes; Cathodes; Clamps; Laboratories; P-i-n diodes; Packaging; Silicon carbide; Switches; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2007 16th IEEE International
Conference_Location
Albuquerque, NM
Print_ISBN
978-1-4244-0913-6
Electronic_ISBN
978-1-4244-0914-3
Type
conf
DOI
10.1109/PPPS.2007.4652365
Filename
4652365
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