Title :
Measurement of random sample time jitter for ADCs
Author :
Hummels, D.M. ; Ahmed, Wahid ; Irons, F.H.
Author_Institution :
Maine Univ., Orono, ME, USA
fDate :
30 Apr-3 May 1995
Abstract :
This paper addresses the measurement of random sample-time jitter in the characterization of ADC´s. A straightforward test is developed which allows for measurement of both additive noise power and RMS sample-time jitter. Simulations are used to assess the accuracy of the technique. Experimental results are also given for a commercially available ADC
Keywords :
analogue-digital conversion; circuit testing; electric noise measurement; jitter; ADC characterisation; RMS sample-time jitter; additive noise power; measurement; random sample time jitter; testing; Additive noise; Clocks; Distortion measurement; Jitter; Nonlinear distortion; Power measurement; Sampling methods; Signal design; Testing; Time measurement;
Conference_Titel :
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2570-2
DOI :
10.1109/ISCAS.1995.521615
