DocumentCode
3118588
Title
Interim report on the round robin result of phase jitter measurement in crystal oscillators and SAW oscillators
Author
Koyama, Mitsuaki ; Hosoda, Tomoyuki ; Uchiyama, Toshikazu
Author_Institution
Nihon Dempa Kogyo Co. Ltd., Sayama
fYear
2006
fDate
38869
Firstpage
251
Lastpage
254
Abstract
In this paper, progress of the domestic (Japan) round robin phase jitter measurement of quartz crystal oscillators and SAW oscillators is explained. Users apply the SONET/SDH analyzer to measure the phase jitter of quartz crystal oscillators and SAW oscillators, which is currently in demand. The SONET/SDH analyzer was chosen as the measurement device with the intention of establishing an international standard. This paper attempts to display the process of international standardization, with reference to the progress of the domestic round robin measurement of quartz crystal oscillators and SAW oscillators. The occurrence of measurement errors, and the values demanded by the users that could not be guaranteed were shown
Keywords
electric noise measurement; jitter; measurement errors; surface acoustic wave oscillators; SAW oscillators; SONET/SDH analyzer; domestic round robin phase jitter measurement; measurement errors; quartz crystal oscillators; Current measurement; Displays; Jitter; Measurement standards; Oscillators; Phase measurement; Round robin; SONET; Surface acoustic waves; Synchronous digital hierarchy;
fLanguage
English
Publisher
ieee
Conference_Titel
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location
Miami, FL
Print_ISBN
1-4244-0074-0
Electronic_ISBN
1-4244-0074-0
Type
conf
DOI
10.1109/FREQ.2006.275390
Filename
4053768
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