• DocumentCode
    3118588
  • Title

    Interim report on the round robin result of phase jitter measurement in crystal oscillators and SAW oscillators

  • Author

    Koyama, Mitsuaki ; Hosoda, Tomoyuki ; Uchiyama, Toshikazu

  • Author_Institution
    Nihon Dempa Kogyo Co. Ltd., Sayama
  • fYear
    2006
  • fDate
    38869
  • Firstpage
    251
  • Lastpage
    254
  • Abstract
    In this paper, progress of the domestic (Japan) round robin phase jitter measurement of quartz crystal oscillators and SAW oscillators is explained. Users apply the SONET/SDH analyzer to measure the phase jitter of quartz crystal oscillators and SAW oscillators, which is currently in demand. The SONET/SDH analyzer was chosen as the measurement device with the intention of establishing an international standard. This paper attempts to display the process of international standardization, with reference to the progress of the domestic round robin measurement of quartz crystal oscillators and SAW oscillators. The occurrence of measurement errors, and the values demanded by the users that could not be guaranteed were shown
  • Keywords
    electric noise measurement; jitter; measurement errors; surface acoustic wave oscillators; SAW oscillators; SONET/SDH analyzer; domestic round robin phase jitter measurement; measurement errors; quartz crystal oscillators; Current measurement; Displays; Jitter; Measurement standards; Oscillators; Phase measurement; Round robin; SONET; Surface acoustic waves; Synchronous digital hierarchy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Frequency Control Symposium and Exposition, 2006 IEEE
  • Conference_Location
    Miami, FL
  • Print_ISBN
    1-4244-0074-0
  • Electronic_ISBN
    1-4244-0074-0
  • Type

    conf

  • DOI
    10.1109/FREQ.2006.275390
  • Filename
    4053768