Title :
Using High-Speed ADC in Frequency Offset and Phase Noise Measurement
Author :
Chen, Shang-Shian ; Liao, Chia-Shu
Author_Institution :
National Time & Frequency Stand. Lab., Chunghwa Telecom Co. Ltd., Taoyuan
Abstract :
This work presents a digital sampling based measurement system to enhance frequency measurement resolution, using high-speed analog-to-digital converters to acquire signal samples, and then using the digital signal processor to average the signal samples in the gate time. Additionally, the phase noise of the device under test can be measured with the designed system
Keywords :
analogue-digital conversion; digital signal processing chips; electric noise measurement; frequency measurement; measurement systems; phase noise; signal sampling; device under test; digital sampling based measurement system; digital signal processor; frequency measurement resolution; frequency offset; high-speed ADC; high-speed analog-to-digital converters; phase noise measurement; signal sampling; Analog-digital conversion; Digital signal processors; Frequency measurement; Noise measurement; Phase measurement; Phase noise; Signal processing; Signal resolution; Signal sampling; Time measurement;
Conference_Titel :
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0074-0
Electronic_ISBN :
1-4244-0074-0
DOI :
10.1109/FREQ.2006.275391
