Investigation of the mesoscopic contact mechanics of sexithienyl thin films

Author

Buzio, R. ; Boragno, C. ; De Mongeot, F. Buatier ; Biscarini, F. ; Valbusa, U.

Author_Institution

Dipt. di Fisica, INFM, Genova, Italy

fYear

2002

fDate

2002

Firstpage

141

Lastpage

142

Abstract

We demonstrate that the mechanical properties of self-affine fractal thin films can be investigated on mesoscopic scale with an atomic force microscope. Sexithienyl films have been studied by acquiring load-displacement curves with flat micrometric tips. It is shown that the mechanical response of these samples strongly depends on their surface morphology, the contact stiffness varying an order of magnitude upon small but significative changes of fractal parameters. This indicates a general route to tailor films properties at the stage of their deposition and growth.

Keywords

atomic force microscopy; elastic constants; fractals; indentation; mechanical contact; organic compounds; plastic deformation; scanning electron microscopy; surface morphology; surface treatment; thin films; atomic force microscope. topography; contact stiffness; deposition; films properties; flat micrometric tips; fractal parameters; growth; load-displacement curves; mechanical properties; mesoscopic contact mechanics; mesoscopic scale; scanning electron microscopy image; self-affine fractal thin films; sexithienyl thin films; surface morphology; Atomic force microscopy; Fractals; Plastics; Probes; Rough surfaces; Surface morphology; Surface resistance; Surface roughness; Surface topography; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Molecular, Cellular and Tissue Engineering, 2002. Proceedings of the IEEE-EMBS Special Topic Conference on

Print_ISBN

0-7803-7557-2

Type

conf

DOI

10.1109/MCTE.2002.1175044

Filename

1175044