Abstract :
The following topics were dealt with: integration testing; economics; enterprise service testing; Verilog design error localization; Oracles; Web service testing; software testing; XML query testing; and genetic algorithms; model-based testing; and test generation techniques.
Keywords :
Web services; XML; automatic test pattern generation; economics; genetic algorithms; hardware description languages; program testing; query processing; Oracles; Verilog design error localization; Web service testing; XML query testing; economics; enterprise service testing; genetic algorithm; integration testing; model-based testing; software testing; test generation technique;
Conference_Titel :
Testing: Academic and Industrial Conference - Practice and Research Techniques, 2009. TAIC PART '09.
Conference_Location :
Windsor
Print_ISBN :
978-0-7695-3820-4
DOI :
10.1109/TAICPART.2009.1
