DocumentCode
3119086
Title
Modeling possible defocus and vibration distortions of infra-red images
Author
Zalevsky, Zeev
Author_Institution
Dept. of Electr. Eng.-Phys. Electron., Tel Aviv Univ., Israel
fYear
2000
fDate
2000
Firstpage
463
Lastpage
467
Abstract
Infra-red (IR) sensors are very common devices for qualitative night observation and intrusion detection. In many applications the IR sensor is being operated from a flying and vibrating platform. In addition, in many applications the sensor is required to detect close as well as remote objects. Placing the sensor over a vibrating platform and scanning close and remote objects often creates corresponding distortions over the captured IR image. A general statistical model for describing the obtained image after incorporating the above-mentioned distortions, is presented. The observed terrain itself is statistically modeled by the first order 2D Markov process known from the literature. The resulting statistical model takes into account various parameters such as the range between the camera and the terrain, the correlation length of the terrain, the type of the vibration and its specifications and the amount of defocus. Special numerical techniques may be applied in order to convert the statistical model into a real 2-D IR image. The formulation derived by this paper may be incorporated in IR simulators that tend to examine the performance of detection algorithms in front of reliable IR images, which take into account various feasible distortions
Keywords
Markov processes; image sensors; infrared imaging; optical correlation; optical focusing; statistical analysis; vibrations; IR sensors; IR simulators; camera; correlation length; defocus distortion; detection algorithms; first order 2D Markov process; infra-red images; infra-red sensors; intrusion detection; modeling; night observation; real 2-D IR image; statistical model; terrain; vibration distortion; Cameras; Detection algorithms; Image converters; Image sensors; Infrared detectors; Infrared image sensors; Infrared sensors; Intrusion detection; Markov processes; Object detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and electronic engineers in israel, 2000. the 21st ieee convention of the
Conference_Location
Tel-Aviv
Print_ISBN
0-7803-5842-2
Type
conf
DOI
10.1109/EEEI.2000.924474
Filename
924474
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