DocumentCode :
3119112
Title :
Reliability of Silicon Resonator Oscillators
Author :
Hsu, Wan-Thai
Author_Institution :
Discera Inc., Ann Arbor, MI
fYear :
2006
fDate :
38869
Firstpage :
389
Lastpage :
392
Abstract :
Low-cost, CMOS oscillators with miniaturized silicon-based MEMS resonators have been out of research laboratories for high volume production. Silicon resonators not only cover all the size reduction roadmaps of quartz crystals, but also lead to a fully-integrated oscillator solution in the near future. The major concerns about silicon resonators are their reliability, including frequency stability over temperature cycling, aging, vibration operation, and shock resistance. This paper demonstrates, for the first time, reliability testing results based on volume manufacturing silicon based oscillators
Keywords :
CMOS integrated circuits; frequency stability; integrated circuit reliability; micromechanical resonators; oscillators; silicon; CMOS oscillators; MEMS resonators; Si; aging; frequency stability; reliability testing; shock resistance; silicon resonator oscillators; size reduction; temperature cycling; vibration operation; volume manufacturing silicon based oscillators; Aging; Crystals; Frequency; Laboratories; Micromechanical devices; Oscillators; Production; Silicon; Stability; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0074-0
Electronic_ISBN :
1-4244-0074-0
Type :
conf
DOI :
10.1109/FREQ.2006.275416
Filename :
4053794
Link To Document :
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