• DocumentCode
    311930
  • Title

    The Simulation And Measurement Of The Temperature Rise In A Power Semiconductor Device Under Transient Conditions

  • Author

    Thomas, K.P. ; Webb, P.W.

  • Author_Institution
    Smiths Industries Aerospace Ltd
  • fYear
    1997
  • fDate
    35460
  • Firstpage
    42491
  • Lastpage
    42496
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Modelling and Simulation for Thermal Management (Digest No. 1997/045), IEE Colloquium on
  • Conference_Location
    IET
  • Type

    conf

  • Filename
    603624