DocumentCode :
311930
Title :
The Simulation And Measurement Of The Temperature Rise In A Power Semiconductor Device Under Transient Conditions
Author :
Thomas, K.P. ; Webb, P.W.
Author_Institution :
Smiths Industries Aerospace Ltd
fYear :
1997
fDate :
35460
Firstpage :
42491
Lastpage :
42496
fLanguage :
English
Publisher :
iet
Conference_Titel :
Modelling and Simulation for Thermal Management (Digest No. 1997/045), IEE Colloquium on
Conference_Location :
IET
Type :
conf
Filename :
603624
Link To Document :
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