• DocumentCode
    3119331
  • Title

    Stability of over-voltage diode characteristics in exploitation conditions

  • Author

    Vujisic, M. ; Osmokrovic, P. ; Stankovic, K. ; Loncar, B.

  • Author_Institution
    Faculty of Electrical Engineering, University of Belgrade, Serbia
  • Volume
    2
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1215
  • Lastpage
    1218
  • Abstract
    The wide-spread use of over-voltage diodes for non-linear over-voltage protection results in a variety of possible working conditions. It is therefore essential to have a thorough insight into their reliability in various exploitation environments. The aim of this paper is to investigate the influence of temperature variation, aging and radiation exposure on over-voltage diode characteristics. Behaviour of over-voltage diodes in the temperature range from −50°C to +150°C was investigated. Aging caused by exploitation was investigated by applying 1000 consecutive double exponential over-voltage pulses to the diode. Radiation effects of Californium-252 combined neutron/gamma radiation were examined. Volt-ampere characteristic, volt-ohm characteristic, and the value of breakdown voltage were used to characterize over-voltage diode operation. Nonlinear coefficient, defined from the volt-ampere curve, was also used as a diode parameter. Over-voltage diodes showed severe deterioration of protective characteristics after being exposed to radiation or elevated temperature, while on the other hand they proved to be highly resistive to aging. Results are presented with the accompaning theoretical interpretations of the observed changes in over-voltage diode behaviour.
  • Keywords
    Aging; Diodes; Electromagnetic measurements; Gamma rays; Ionizing radiation; Neutrons; Protection; Stability; Temperature distribution; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2007 16th IEEE International
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0913-6
  • Electronic_ISBN
    978-1-4244-0914-3
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4652405
  • Filename
    4652405