DocumentCode
3119375
Title
Treatment of Flicker Noise in Oscillators and Methods of Its Suppression
Author
Tsarapkin, Dmitry P.
Author_Institution
Radio Eng. Fac., Moscow Power Eng. Inst.
fYear
2006
fDate
38869
Firstpage
452
Lastpage
456
Abstract
This paper deals with impact to oscillator phase noise from flicker noise in elements of oscillator circuitry and aims to estimate an available level of close-in phase noise in perspective oscillator schemes and discuss some ways of phase noise improvement. The treatment exploits an idea that any structural element of an oscillator, e. g., any stage of a cascaded sustaining amplifier operates, besides its main function, like a variable phase shifter guided with noise which modulates an induced phase shift. This approach explains the PM noise dependence on power gain in bipolar transistor amplifiers and helps to optimize a number of stages. The paper undeceives a widely distributed opinion that an amplifier design technique that achieves highly linear operation certainly lowers oscillator phase noise. As estimated, an X-band room temperature bridge-type oscillator can reach as low phase noise as -(140...145) dBc/Hz at 1 kHz offset. The theoretical limit of phase noise in optimized oscillators equipped with an automatic frequency control is approximately -165 dBc/Hz in the same conditions
Keywords
automatic frequency control; bipolar analogue integrated circuits; bridge circuits; flicker noise; oscillators; phase noise; phase shifters; 1 kHz; PM noise dependence; amplifier design techniques; automatic frequency control; bipolar transistor amplifiers; bridge type oscillator; cascaded sustaining amplifier; flicker noise treatment; low phase noise; oscillator phase noise; phase shifter; 1f noise; Bipolar transistors; Circuits; Distributed amplifiers; Oscillators; Phase estimation; Phase modulation; Phase noise; Phase shifters; Power amplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location
Miami, FL
Print_ISBN
1-4244-0074-0
Electronic_ISBN
1-4244-0074-0
Type
conf
DOI
10.1109/FREQ.2006.275428
Filename
4053806
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