DocumentCode
3119467
Title
Test Generation with Context Free Grammars and Covering Arrays
Author
Hoffman, Daniel ; Sobotkiewicz, Lewis ; Wang, Hong-Yi ; Strooper, Paul ; Bazdell, Gary ; Stevens, Brett
Author_Institution
Dept. of Comput. Sci., Univ. of Victoria, Victoria, BC, Canada
fYear
2009
fDate
4-6 Sept. 2009
Firstpage
43
Lastpage
47
Abstract
Covering arrays and context-free grammars have seen extensive use in software test generation. A covering-array algorithm takes a list of domains and generates a subset of the cartesian product of the domains. A grammar-based test generation (GBTG) algorithm takes a grammar G and generates a subset of the language accepted by G. Covering arrays and GBTG are usually applied independently. We show that CFG rules and covering-array specifications can be freely intermixed, with precise, intuitive semantics and efficient generation. We present a novel approach for ``tagging´´ grammars with specifications for mixed-strength covering arrays, a generalization of conventional covering arrays. We have developed algorithms for test generation and implemented a tool for generating test cases from tagged grammars.
Keywords
context-free grammars; program testing; context free grammars; covering arrays; semantics; software test generation; tagged grammars; Australia; Computer industry; Computer science; Mathematics; Operating systems; Software testing; Statistics; Sun; System testing; Tagging;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing: Academic and Industrial Conference - Practice and Research Techniques, 2009. TAIC PART '09.
Conference_Location
Windsor
Print_ISBN
978-0-7695-3820-4
Type
conf
DOI
10.1109/TAICPART.2009.35
Filename
5381648
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