DocumentCode :
3119467
Title :
Test Generation with Context Free Grammars and Covering Arrays
Author :
Hoffman, Daniel ; Sobotkiewicz, Lewis ; Wang, Hong-Yi ; Strooper, Paul ; Bazdell, Gary ; Stevens, Brett
Author_Institution :
Dept. of Comput. Sci., Univ. of Victoria, Victoria, BC, Canada
fYear :
2009
fDate :
4-6 Sept. 2009
Firstpage :
43
Lastpage :
47
Abstract :
Covering arrays and context-free grammars have seen extensive use in software test generation. A covering-array algorithm takes a list of domains and generates a subset of the cartesian product of the domains. A grammar-based test generation (GBTG) algorithm takes a grammar G and generates a subset of the language accepted by G. Covering arrays and GBTG are usually applied independently. We show that CFG rules and covering-array specifications can be freely intermixed, with precise, intuitive semantics and efficient generation. We present a novel approach for ``tagging´´ grammars with specifications for mixed-strength covering arrays, a generalization of conventional covering arrays. We have developed algorithms for test generation and implemented a tool for generating test cases from tagged grammars.
Keywords :
context-free grammars; program testing; context free grammars; covering arrays; semantics; software test generation; tagged grammars; Australia; Computer industry; Computer science; Mathematics; Operating systems; Software testing; Statistics; Sun; System testing; Tagging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Testing: Academic and Industrial Conference - Practice and Research Techniques, 2009. TAIC PART '09.
Conference_Location :
Windsor
Print_ISBN :
978-0-7695-3820-4
Type :
conf
DOI :
10.1109/TAICPART.2009.35
Filename :
5381648
Link To Document :
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