Boundary Value Testing Using Integrated Circuit Fault Detection Rule

Boundary value testing is a widely used functional testing approach. This paper presents a new boundary value selection approach by applying fault detection rules for integrated circuits. Empirical studies based on Redundant Strapped-Down Inertial Measurement Unit of the 34 program versions and 426 mutants compare the new approach to the current boundary value testing methods. The results show that the approach proposed in this paper is remarkably effective in conquering test blindness, reducing test cost and improving fault coverage.