Title :
Cathode ray tube manufacturing and recycling: analysis of industry survey
Author :
Monchamp, A. ; Evans, H. ; Nardone, J. ; Wood, S. ; Proch, E. ; Wagner, T.
Author_Institution :
Electron. Ind. Alliance, Arlington, VA, USA
Abstract :
Recycling end-of-life electronics is an important and growing issue facing the electronics industry. Public awareness of the issue is rising, largely because it continues to draw significant media attention and is the subject of increased local, state, federal and international regulation. These developments pose new challenges for the electronics industry and require company, as well as industry-wide, responses. At the same time, these developments provide an opportunity for the industry to inform law makers and the public about the electronics industry´s accomplishments and efforts to address issues related to the management of end-of-life electronics. This paper summarizes the findings of a survey conducted by the Electronic Industries Alliance (EIA) that evaluated the current volume of manufacturing and recycling of cathode ray tube (CRT) glass by the United States (US) CRT glass manufacturers. The purpose of this paper is to evaluate the survey findings and determine if the CRT glass manufacturing industry has the capacity to absorb an increased volume of recycled glass that may result from efforts at the federal and state level to increase collection of CRTs
Keywords :
cathode-ray tubes; electron tube manufacture; manufacturing industries; recycling; CRT glass manufacturers; Electronic Industries Alliance; United States; cathode ray tube manufacturing; cathode ray tube recycling; end-of-life electronics recycling; industry survey analysis; international regulation; Cathode ray tubes; Computer aided manufacturing; Electronics industry; Glass manufacturing; Industrial electronics; Manufacturing industries; Pulp manufacturing; Raw materials; Recycling; Wood industry;
Conference_Titel :
Electronics and the Environment, 2001. Proceedings of the 2001 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-6655-7
DOI :
10.1109/ISEE.2001.924500