• DocumentCode
    3119739
  • Title

    Measurements of Doubly-Rotated-Cuts of Langasite Isomorph

  • Author

    Kim, Yoonkee

  • Author_Institution
    Dev. & Eng. Center, U.S. Army Commun.-Electron. Res., Fort Monmouth, NJ
  • fYear
    2006
  • fDate
    38869
  • Firstpage
    563
  • Lastpage
    566
  • Abstract
    In this paper, we report the measured properties of doubly-rotated cuts of bulk-acoustic-wave resonators made of a langasite isomorph material. Test resonators with planoconvex blanks (14 mm diameter, 2 diopter, nominal 10 MHz 5th OT) were fabricated for four different cuts: (thetas = 10deg, phi = 10deg), (thetas = 10deg, phi = 20deg), (thetas = 20deg, phi = 10deg), (thetas = 20deg, phi = 20deg). Using an impedance analyzer, we were able to measure strongly excited fundamental and 3rd overtones of the c- and b-modes, along with their anharmonic modes, as evidenced by their low motional resistances. The a-modes were weakly excited but could also be measured. The theoretical values of eigenmode velocities and piezoelectric coupling coefficients of the doubly-rotated cuts were obtained by solving Christoffel equations. The theoretical values were compared to the measured ones. The frequency-temperature (f-t) characteristics were also measured in the temperature range of -55 degC to 85 degC. The f-t curves of the c- and b-modes showed parabolic characteristics
  • Keywords
    bulk acoustic wave devices; crystal resonators; gallium compounds; lanthanum compounds; piezoelectricity; -55 to 85 C; 3rd overtones; Christoffel equation; La3Ga3SiO14; La3Ga5.5Nb0.5O14; La3Ga5.5Ta0.5O14; bulk acoustic wave resonators; doubly-rotated-cuts; eigenmode velocity; frequency-temperature characteristics; impedance analyzer; langasite isomorph material; motional resistance; piezoelectric coupling coefficient; planoconvex blanks; strongly excited fundamental overtones; Electrical resistance measurement; Equations; Frequency control; Harmonic analysis; Impedance measurement; Motion analysis; Temperature distribution; Temperature measurement; Temperature sensors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Frequency Control Symposium and Exposition, 2006 IEEE
  • Conference_Location
    Miami, FL
  • Print_ISBN
    1-4244-0074-0
  • Electronic_ISBN
    1-4244-0074-0
  • Type

    conf

  • DOI
    10.1109/FREQ.2006.275448
  • Filename
    4053826