مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3119764

Title :

Author index

fYear :

2004

fDate :

22-25 March 2004

Firstpage :

309

Lastpage :

312

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on

Conference_Location :

Awaji Yumebutai, Japan

Print_ISBN :

0-7803-8262-5

Type :

conf

DOI :

10.1109/ICMTS.2004.1309502

Filename :

1309502

Link To Document :