DocumentCode :
3119965
Title :
Automatic Assessment of Voice Quality According to the GRBAS Scale
Author :
Saenz-Lechon, Nicolas ; Godino-Llorente, Juan I. ; Osma-Ruiz, Victor ; Blanco-Velasco, Manuel ; Cruz-Roldan, Fernando
Author_Institution :
Dept. de Ingenieria de Circuitos y Sistemas, Univ. Politecnica de Madrid
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
2478
Lastpage :
2481
Abstract :
Nowadays, the most extended techniques to measure the voice quality are based on perceptual evaluation by well trained professionals. The GRBAS scale is a widely used method for perceptual evaluation of voice quality. The GRBAS scale is widely used in Japan and there is increasing interest in both Europe and the United States. However, this technique needs well-trained experts, and is based on the evaluator´s expertise, depending a lot on his own psycho-physical state. Furthermore, a great variability in the assessments performed from one evaluator to another is observed. Therefore, an objective method to provide such measurement of voice quality would be very valuable. In this paper, the automatic assessment of voice quality is addressed by means of short-term Mel cepstral parameters (MFCC), and learning vector quantization (LVQ) in a pattern recognition stage. Results show that this approach provides acceptable results for this purpose, with accuracy around 65% at the best
Keywords :
cepstral analysis; diseases; psychology; speech; speech processing; speech recognition; vector quantisation; GRBAS scale; Mel cepstral parameters; acoustic analysis; evaluator expertise; learning vector quantization; organic pathologies; pattern recognition; perceptual evaluation; psycho-physical state; speech processing; voice quality automatic assessment; voice quality measurement; Circuits; Cities and towns; Convergence; Morphology; Pathology; Protocols; Psychoacoustic models; Psychology; Speech analysis; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260603
Filename :
4462297
Link To Document :
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