DocumentCode :
3120023
Title :
Plasma-resonant THz detection with HEMTs
Author :
Mateos, J. ; Marinchio, H. ; Palermo, C. ; Varani, L. ; Gonzá, T.
Author_Institution :
Dept. de Fis. Aplic., Univ. de Salamanca, Salamanca, Spain
fYear :
2010
fDate :
May 31 2010-June 4 2010
Firstpage :
1
Lastpage :
4
Abstract :
In this work, by means of Monte Carlo simulations we analyze the dependence of the DC drain current value in a 80 nm-gate InAlAs/InGaAs HEMTs on the frequency of a sinusoidal signal superimposed to the DC gate bias. Interestingly, a resonant peak appears in the drain current response, which lies in the THz frequency range, in good agreement with recent experiments made on similar devices. Moreover, the frequency of the resonant peak is dependent on the length of the source-gate region, but independent of the length of the drain-gate region, thus indicating that the source-gate region acts as the plasma wave cavity leading to the resonant detection of THz radiation in HEMTs.
Keywords :
III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium compounds; high electron mobility transistors; indium compounds; plasma waves; terahertz waves; DC drain current; DC gate bias; HEMT; InAlAs-InGaAs; Monte Carlo simulations; drain current response; drain-gate region; plasma wave cavity; plasma-resonant THz detection; sinusoidal signal frequency; size 80 nm; source-gate region; HEMTs; Indium compounds; Indium gallium arsenide; MODFETs; Plasma simulation; Plasma waves; Radiation detectors; Resonance; Resonant frequency; Signal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide & Related Materials (IPRM), 2010 International Conference on
Conference_Location :
Kagawa
ISSN :
1092-8669
Print_ISBN :
978-1-4244-5919-3
Type :
conf
DOI :
10.1109/ICIPRM.2010.5516389
Filename :
5516389
Link To Document :
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