Title :
Classify the number of EEG current sources using support vector machines
Author :
Huang, Wen-Yan ; Shen, Xue-Qin ; Wu, Qing
Author_Institution :
Sch. of Software & Comput. Sci., Hebei Univ. of Technol., Tianjin, China
Abstract :
The classifier based on support vector machines (SVMs) has had successful applications in many fields for its simple structure and excellent learning performance. In this paper we apply such classifiers to the EEG (electroencephalogram) data and use them to determine the number of EEG current sources according to the scalp potentials. Experimental results indicate that SVM classifiers are an effective and promising approach for this task.
Keywords :
electroencephalography; learning systems; medical signal processing; optimisation; pattern classification; EEG; Gaussian kernels; current dipole; learning; nonlinear optimization; pattern classification; scalp potentials; support vector machine; training set; Brain modeling; Distributed computing; Electroencephalography; Machine learning; Magnetic heads; Pattern recognition; Scalp; Software performance; Support vector machine classification; Support vector machines;
Conference_Titel :
Machine Learning and Cybernetics, 2002. Proceedings. 2002 International Conference on
Print_ISBN :
0-7803-7508-4
DOI :
10.1109/ICMLC.2002.1175348