DocumentCode :
3120454
Title :
L-band slot antenna design for gigawatt-level single-pulse microwave sources
Author :
Haworth ; Calico, S.E. ; Clark, M.C. ; Coleman, P.D. ; Hendricks, K.J. ; McGrath, D.T. ; Sedillo, Robert ; Spencer, T.A.
Author_Institution :
WSQ Div., Philips Lab., Kirkland, NM, USA
fYear :
1996
fDate :
3-5 June 1996
Firstpage :
287
Abstract :
Summary form only given, as follows. One significant problem with the evacuated Vlasov antenna used in the present-day gigawatt-level, 1.2-GHz magnetically insulated line oscillator (MILO) experiments is rf breakdown in the antenna aperture. In order to reduce the field stress inherent in a single-aperture antenna at gigawatt power levels, an 81-slot non-resonant (traveling wave) antenna has been constructed. The intent of this design is to reduce the rf electric field in any one aperture below the vacuum breakdown threshold, and yet maintain a desirable far-field pattern having a localized and intense power density profile. We report on cold testing results from the slot antenna as well as on theoretical analysis of the antenna using a transmission line model aided by computer simulations. In addition, experimental data obtained using this antenna on MILO are presented.
Keywords :
discharges (electric); microwave antennas; microwave generation; microwave oscillators; simulation; slot antennas; transmission lines; travelling wave tubes; 1.2 GHz; L-band slot antenna design; RF breakdown; RF electric field; antenna aperture; computer simulations; evacuated Vlasov antenna; far-field pattern; field stress; gigawatt-level single-pulse microwave sources; intense power density profile; magnetically insulated line oscillator; nonresonant traveling wave antenna; single-aperture antenna; transmission line model; Antenna theory; Aperture antennas; Electric breakdown; Insulation; L-band; Oscillators; Slot antennas; Stress; Transmission line antennas; Vacuum breakdown;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location :
Boston, MA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3322-5
Type :
conf
DOI :
10.1109/PLASMA.1996.551641
Filename :
551641
Link To Document :
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