Title :
Development of Multiharmonic Verification Artifact for the LSNA and NVNA (MTT-11)
Author :
Haedong Jang ; Youngseo Ko ; Roblin, Patrick
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Abstract :
In this article, a unique approach is presented to design and fabricate a circuit, rich in nonlinear contents with reduced sensitivity to bias, temperature, and load variations so that it can be used to validate the performance of LSNAs or NVNAs. This circuit was judged to be a joint winner in the 2012 IEEE MTT-S International Microwave Symposium (IMS2012) Student Design Competition, Design of a Calibration Verification Artifact for Nonlinear VNA, sponsored by MTT-11 Microwave Measurements.
Keywords :
network analysers; LSNA; MTT-11 Microwave Measurements; NVNA MTT-11; large-signal vector network analyzers; multiharmonic verification artifact design; nonlinear VNA; nonlinear contents; nonlinear vector network analyzer; Calibration; Frequency measurement; Harmonic analysis; Logic gates; Phase measurement; Radio frequency; Vector network analysis; Voltage measurement;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/MMM.2012.2226640
