DocumentCode
3120737
Title
Nanocharacterization of a novel copper-membrane and functionalized insulator-semiconductor by atomic force microscopy
Author
De Oliveira, I. A Marques ; Pla, M. ; Escriche, Li ; Casabó, J. ; Zine, N. ; Bausells, J. ; Bessueille, F. ; Samitier, J. ; Errachid, A.
Author_Institution
Lab. NanoBioenginyeria, PCB, Barcelona, Spain
fYear
2004
fDate
24-27 Oct. 2004
Firstpage
726
Abstract
We describe the characterization of a novel copper-sensitive polymeric membrane and the electrochemical response of electrolyte-membrane-insulator-semiconductor structures. The membrane has shown a Nernstian response towards Cu(II) ions in electrodes.
Keywords
atomic force microscopy; copper; electrochemical sensors; electrolytes; ions; membranes; polymers; substrates; Cu; Nernstian response; atomic force microscopy; copper ions; copper-sensitive polymeric membrane; electrolyte-membrane-insulator-semiconductor structures; functionalized insulator-semiconductor substrate; nanocharacterization; sensors; Atomic force microscopy; Biomembranes; Copper; Electrodes; Insulation; Methanol; Nanobioscience; Nitrogen; Polymers; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2004. Proceedings of IEEE
Print_ISBN
0-7803-8692-2
Type
conf
DOI
10.1109/ICSENS.2004.1426270
Filename
1426270
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