Title :
Ultraprecision Finishing Process for Improving Thickness Distribution of Quartz Crystal Wafer by Utilizing Atmospheric Pressure Plasma
Author :
Yamamura, Kazuya ; Sano, Yasuhisa ; Mori, Yuzo ; Shibahara, Masafumi
Author_Institution :
Res. Center for Ultra-Precision Sci. & Technol., Osaka Univ., Suita
Abstract :
A new machining process was developed which is named plasma chemical vaporization machining (PCVM) for improving the thickness uniformity of thin quartz crystal wafer. This process utilizes atmospheric pressure plasma, and has excellent performances in removal rate and spatial resolution of the machining. In this process, thickness distribution of the quartz crystal wafer is corrected by numerically controlled machining. By using our correcting process, thickness distribution of an AT cut quartz wafer was improved from 270 nm to 50 nm. And spurious mode in the resonance curve was reduced by improving the parallelism of the quartz crystal wafer
Keywords :
finishing; micromachining; nanotechnology; plasma materials processing; quartz; AT cut quartz wafer; SiO2; atmospheric pressure plasma; crystal wafer parallelism; machining process; plasma chemical vaporization machining; quartz crystal wafer; resonance curve; spurious mode; thickness distribution improvement; ultraprecision finishing; Atmospheric-pressure plasmas; Chemical technology; Electrodes; Fabrication; Finishing; Machining; Nuclear and plasma sciences; Plasma chemistry; Resonance; Resonant frequency;
Conference_Titel :
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0074-0
Electronic_ISBN :
1-4244-0074-0
DOI :
10.1109/FREQ.2006.275500