• DocumentCode
    3120977
  • Title

    Challenge of a multiple-valued technology in recent deep-submicron VLSI

  • Author

    Hanyu, Takahiro

  • Author_Institution
    Dept. of Comput. & Math. Sci., Tohoku Univ., Sendai, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    A logic-in-memory VLSI architecture based on multiple-valued floating-gate MOS pass-transistor logic is proposed to solve a communication bottleneck between modules in the recent deep-submicron VLSI. Moreover, a multiple-valued current-mode circuit based on dual-rail differential logic is also proposed as a candidate suitable for self-checking and asynchronous VLSI systems. Finally, the advantage of the above multiple-valued circuit technologies is shown by using design examples
  • Keywords
    MOS logic circuits; VLSI; logic testing; multivalued logic circuits; asynchronous VLSI systems; communication bottleneck; deep-submicron VLSI; design examples; dual-rail differential logic; logic-in-memory VLSI architecture; multiple-valued circuit technologies; multiple-valued floating-gate MOS pass-transistor logic; multiple-valued technology; self-checking; CADCAM; CMOS technology; Circuit synthesis; Circuit testing; Computer aided manufacturing; Logic circuits; MOSFETs; Nonvolatile memory; Switching circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multiple-Valued Logic, 2001. Proceedings. 31st IEEE International Symposium on
  • Conference_Location
    Warsaw
  • ISSN
    0195-623X
  • Print_ISBN
    0-7695-1083-3
  • Type

    conf

  • DOI
    10.1109/ISMVL.2001.924579
  • Filename
    924579