• DocumentCode
    3121111
  • Title

    Intel 300 mm fab layout and material handling automation integration learning

  • Author

    Carriker, Wayne

  • Author_Institution
    LTD Autom., Intel Corp., Hillsboro, OR, USA
  • fYear
    2004
  • fDate
    4-6 May 2004
  • Firstpage
    257
  • Lastpage
    261
  • Abstract
    As Intel has moved into 300 mm manufacturing, we have identified key fab layout and material handling integration lessons. By incorporating learnings from our first generation facilities, we believe our new fabs are well positioned to provide efficient operations and the cost benefits expected from 300 mm. Now we are exploring the issues faced in enhancing our initial 300 mm factories as well as converting our 200 mm facilities in a cost effective manner. In addition, we have also started to look at a couple of key issues facing process development in the highly automated 300 mm environment: split/merge operations, and ad-hoc processing. Identifying solutions in these areas is important to allow technology to continue at the demanding pace of Moore´s law.
  • Keywords
    facilities layout; integrated circuit manufacture; intelligent manufacturing systems; materials handling; 200 mm; 300 mm; Intel fab layout; Moores law; ad hoc processing; cost effective analysis; material handling automation; material handling integration learning; material handling integration lessons; process development; split-merge operations; Costs; Design automation; Manuals; Manufacturing automation; Manufacturing processes; Materials handling; Production facilities; Semiconductor device manufacture; Uninterruptible power systems; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing, 2004. ASMC '04. IEEE Conference and Workshop
  • Print_ISBN
    0-7803-8312-5
  • Type

    conf

  • DOI
    10.1109/ASMC.2004.1309578
  • Filename
    1309578