DocumentCode :
3121137
Title :
A Cluster-Based Approach for Semantic Similarity in the Biomedical Domain
Author :
Al-Mubaid, Hisham ; Nguyen, Hoa A.
Author_Institution :
Univ. of Houston-Clear Lake, Houston, TX
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
2713
Lastpage :
2717
Abstract :
We propose a new cluster-based semantic similarity/distance measure for the biomedical domain within the framework of UMLS. The proposed measure is based mainly on the cross-modified path length feature between the concept nodes, and two new features: (1) the common specificity of two concept nodes, and (2) the local granularity of the clusters. We also applied, for comparison purpose, five existing general English ontology-based similarity measures into the biomedical domain within UMLS. The proposed measure was evaluated relative to human experts´ ratings, and compared with the existing techniques using two ontologies (MeSH and SNOMED-CT) in UMLS. The experimental results confirmed the efficiency of the proposed method, and showed that our similarity measure gives the best overall results of correlation with human ratings. We show, further, that using MeSH ontology produces better semantic correlations with human experts´ scores than SNOMED-CT in all of the tested measures
Keywords :
medical computing; medical information systems; ontologies (artificial intelligence); pattern clustering; semantic networks; vocabulary; MeSH ontology; Medical Subject Headings; SNOMED-CT ontologies; Systemized Nomenclature of Medicine Clinical Term; UMLS; Unified Medical Language System; biomedical domain; cluster-based distance measures; cluster-based semantic similarity measures; cross-modified path length feature; Biomedical measurements; Cities and towns; Humans; Lakes; Length measurement; Natural language processing; Ontologies; Testing; USA Councils; Unified modeling language;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.259235
Filename :
4462356
Link To Document :
بازگشت