Title :
Manufacturing efficiency improvement through automation of test wafer procedures
Author :
Ferland, Patrick ; Labonte, Andre
Author_Institution :
Nat. Semicond. Corp., South Portland, ME, USA
Abstract :
One of the critical challenges facing semiconductor manufacturing in today´s competitive market is the need to drive profitability by increasing efficiency without increasing headcount. A traditionally manpower-intensive area of manufacturing is tool qualification test wafer management. A study is presented using a seven-step focused-improvement methodology to develop and implement Computer-Integrated Manufacturing (CIM) tools to reduce manual intervention in test wafer management for labor and error minimization.
Keywords :
computer integrated manufacturing; electronics industry; quality management; semiconductor device manufacture; CIM; automation; computer integrated manufacturing; error minimization; manufacturing efficiency improvement; semiconductor manufacturing; seven step focused improvement team; tool qualification test wafer management; Automatic testing; Computer aided manufacturing; Computer integrated manufacturing; Etching; Manufacturing automation; Production; Profitability; Qualifications; Semiconductor device manufacture; System testing;
Conference_Titel :
Advanced Semiconductor Manufacturing, 2004. ASMC '04. IEEE Conference and Workshop
Print_ISBN :
0-7803-8312-5
DOI :
10.1109/ASMC.2004.1309589
