DocumentCode
3121783
Title
Silicon carbide power devices: hopeful or hopeless?
Author
Johnson, C. Mark ; Wright, Nick G. ; Ortolland, Sylvie ; Morrison, Dominique ; Adachi, Kazuhiro ; O´Neill, Anthony
Author_Institution
Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
fYear
1999
fDate
1999
Firstpage
42644
Lastpage
42648
Abstract
Wide band gap semiconductors, such as SiC, GaN and diamond, offer the potential to overcome both the temperature and voltage blocking limitations of Si. In essence, the high voltage capability derives from the fact that the critical electric field of the material increases with band-gap whilst the high temperature capability derives from a reduction in intrinsic carrier concentration with increasing band-gap. The idealised, theoretical performance of a semiconductor material may be evaluated for a specific application using an appropriate figure of merit. Such comparisons typically yield figures showing improvements of orders of magnitude over conventional Si devices
Keywords
silicon compounds; SiC; SiC power devices; critical electric field; figure of merit; high temperature capability; high voltage capability; intrinsic carrier concentration; temperature limitations; voltage blocking limitations; wide band gap semiconductors;
fLanguage
English
Publisher
iet
Conference_Titel
Recent Advances in Power Devices (Ref. No. 1999/104), IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19990600
Filename
789950
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