• DocumentCode
    3121783
  • Title

    Silicon carbide power devices: hopeful or hopeless?

  • Author

    Johnson, C. Mark ; Wright, Nick G. ; Ortolland, Sylvie ; Morrison, Dominique ; Adachi, Kazuhiro ; O´Neill, Anthony

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    42644
  • Lastpage
    42648
  • Abstract
    Wide band gap semiconductors, such as SiC, GaN and diamond, offer the potential to overcome both the temperature and voltage blocking limitations of Si. In essence, the high voltage capability derives from the fact that the critical electric field of the material increases with band-gap whilst the high temperature capability derives from a reduction in intrinsic carrier concentration with increasing band-gap. The idealised, theoretical performance of a semiconductor material may be evaluated for a specific application using an appropriate figure of merit. Such comparisons typically yield figures showing improvements of orders of magnitude over conventional Si devices
  • Keywords
    silicon compounds; SiC; SiC power devices; critical electric field; figure of merit; high temperature capability; high voltage capability; intrinsic carrier concentration; temperature limitations; voltage blocking limitations; wide band gap semiconductors;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Recent Advances in Power Devices (Ref. No. 1999/104), IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19990600
  • Filename
    789950