• DocumentCode
    3122215
  • Title

    Reducing surface loss in 3D microwave copper cavities for superconducting transmon qubits

  • Author

    Bogorin, Daniela F. ; Ware, Matthew ; McClure, Doug T. ; Sorokanich, Stephen ; Plourde, B.L.T.

  • Author_Institution
    Dept. of Phys., Syracuse Univ., Syracuse, NY, USA
  • fYear
    2013
  • fDate
    7-11 July 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The recent implementation of three-dimensional microwave cavities coupled to superconducting transmon qubits has led to dramatic improvements in qubit coherence times [1]. Besides the superconducting aluminum cavities that have been used in many such measurements, other recent experiments have utilized copper cavities [2] with coherence times now approaching 0.1 ms. We are investigating the effects on the quality factor for three-dimensional copper cavities that have the cavity-wall surfaces electropolished and coated with a superconducting tin layer. The copper base provides a good path for thermalizing the cavity walls and qubit chip, while the surface treatment reduces the microwave loss. We have measured a superconducting transmon qubit in such a cavity and we report our low-temperature coherence results on the same qubit and cavity measured in two different labs.
  • Keywords
    Q-factor; SQUIDs; aluminium; copper; electrolytic polishing; quantum electrodynamics; quantum optics; superconducting cavity resonators; surface treatment; tin; 3D microwave cavities; cavity-wall surfaces; electropolishing; microwave loss; qubit coherence times; superconducting transmon qubits; surface loss reduction; surface treatment; Cavity resonators; Copper; Microwave measurement; Semiconductor device measurement; Superconducting microwave devices; Surface treatment; Temperature measurement; 3D cavity resonators; cQED; cavity quality factor; superconducting qubits; transmon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Superconductive Electronics Conference (ISEC), 2013 IEEE 14th International
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    978-1-4673-6369-3
  • Type

    conf

  • DOI
    10.1109/ISEC.2013.6604283
  • Filename
    6604283