DocumentCode
3122547
Title
Optimized Redundancy Selection Based On Failure-related Yield Model For 64Mb DRAM And Beyond
Author
Kikuda, Shigeru ; Miyamoto, Hiroshi ; Mori, Shigeru ; Niiro, Mitsutaka ; Yarrada, M.
Author_Institution
Mitsubishi Electric Corporation
fYear
1991
fDate
13-15 Feb. 1991
Firstpage
104
Lastpage
105
Keywords
Circuit faults; Decoding; Electrical fault detection; Fabrication; Fault detection; Poisson equations; Random access memory; Redundancy; Semiconductor device modeling; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-87942-644-6
Type
conf
DOI
10.1109/ISSCC.1991.689082
Filename
689082
Link To Document