Title :
Design for testability for mixed analog/digital ASICs
Author :
Fasang, Patrick P. ; Mullins, D. ; Wong, Ted
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
Abstract :
A description is given of the concept and issues of design for testability for mixed analog-digital circuits, an architecture for testable circuits of this type, general testing procedure, and the concept of analog test tables. The analog test tables contain information such as what parameters are selected for testing, what nodes need to be accessible, and testing conditions
Keywords :
digital integrated circuits; integrated circuit technology; integrated circuit testing; linear integrated circuits; accessible nodes; analog digital chips; analog macros; analog test tables; architecture for testable circuits; design for testability; mixed analog/digital ASICs; testing conditions; testing procedure; Analog circuits; Application specific integrated circuits; Circuit testing; Controllability; Design for testability; Digital circuits; Observability; Operational amplifiers; Resistors; Switching converters;
Conference_Titel :
Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988
Conference_Location :
Rochester, NY
DOI :
10.1109/CICC.1988.20881
