DocumentCode
3122885
Title
STM-SQUID microscopy using a fine probe
Author
Watanabe, N. ; Miyato, Y. ; Itozaki, H.
Author_Institution
Grad. Sch. of Eng. Sci., Osaka Univ., Toyonaka, Japan
fYear
2013
fDate
7-11 July 2013
Firstpage
1
Lastpage
3
Abstract
We developed an STM-SQUID microscope by combining a scanning tunneling microscope (STM) and a superconducting quantum interference device (SQUID) in order to observe the local magnetic structure of magnetic materials. The STM-SQUID microscope features a high permeability permalloy probe placed between the SQUID and the sample to serve as a flux guide. The magnetic field of the sample surface was effectively transmitted to the SQUID using this method, so it substantially improved the spatial resolution. However, simulation experiments showed that the shape of probe tip greatly influenced the spatial resolution of the magnetic field images, so we investigated this phenomenon further. The signal-noise ratio in magnetic images obtained with the STM-SQUID microscope is improved by using a permalloy probe for which the radius and cone angle of the probe tip are small.
Keywords
Permalloy; SQUIDs; magnetic flux; magnetic permeability; magnetic structure; probes; scanning tunnelling microscopy; STM-SQUID microscopy; flux guide; local magnetic structure; magnetic field; magnetic materials; permalloy probe; permeability; scanning tunneling microscopy; signal-noise ratio; spatial resolution; superconducting quantum interference device; Films; Magnetic domains; Magnetic fields; Magnetic force microscopy; Microscopy; Probes; SQUIDs; SQUID microscope; high-Tc rf-SQUID; permalloy probe; scanning tunneling microscope;
fLanguage
English
Publisher
ieee
Conference_Titel
Superconductive Electronics Conference (ISEC), 2013 IEEE 14th International
Conference_Location
Cambridge, MA
Print_ISBN
978-1-4673-6369-3
Type
conf
DOI
10.1109/ISEC.2013.6604311
Filename
6604311
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