Title :
Design and test of a 2Gb/s GaAs 16/8 bit MUX/DEMUX pair
Author :
Cheney, Bruce ; Hamilton, Pat
Author_Institution :
TriQuint Semicond., Beaverton, OR, USA
Abstract :
As an example of the state-of-the-art of commercial MSI digital GaAs integrated circuits in high-volume production, a 16/8-bit MUX/DEMUX (multiplexer/demultiplexer) pair designed with a GaAs standard cell approach is presented. These designs feature ECL (emitter-coupled logic) compatibility and can support data rates up to 2 Gb/s. In addition to a review of the design aspects of these devices, the development of a high-speed production test system is presented
Keywords :
III-V semiconductors; data communication equipment; digital communication systems; field effect integrated circuits; gallium arsenide; integrated circuit testing; integrated logic circuits; logic testing; multiplexing equipment; production testing; 16 bit; 2 Gbit/s; 8 bit; BFL; ECL compatibility; GaAs integrated circuits; MESFET process; MSI; MUX/DEMUX pair; buffered FET logic; data communication equipment; design aspects; digital IC; high-speed production test system; high-volume production; multiplexer/demultiplexer; Clocks; Costs; Data communication; Digital integrated circuits; Digital systems; Gallium arsenide; Optical fibers; Production systems; System testing; Timing;
Conference_Titel :
Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988
Conference_Location :
Rochester, NY
DOI :
10.1109/CICC.1988.20885
