DocumentCode

3123411

Title

Leakage-induced signal degradation in VLSI interconnection for buffered bus line & logic

Author

Aum, Paul

Author_Institution

Spider Systems

fYear

2004

fDate

2004

Firstpage

13

Lastpage

13

Keywords

Degradation; Logic; Production systems; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on

Print_ISBN

0-7803-8528-4

Type

conf

DOI

10.1109/ICICDT.2004.1309892

Filename

1309892