Title :
Leakage-induced signal degradation in VLSI interconnection for buffered bus line & logic
Author_Institution :
Spider Systems
Keywords :
Degradation; Logic; Production systems; Very large scale integration;
Conference_Titel :
Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on
Print_ISBN :
0-7803-8528-4
DOI :
10.1109/ICICDT.2004.1309892
