DocumentCode :
3123625
Title :
A 33ns 64Mb DRAM
Author :
Oowaki, Y. ; Tsuchida, K. ; Watanabe, Y. ; Takashima, D. ; Ohta, M. ; Nakano, H. ; Watanabe, S. ; Nitayama, A. ; Horiguchi, F. ; Ohuchi, K. ; Masuoka, F. ; Hara, H.
Author_Institution :
Toshiba Corporation
fYear :
1991
fDate :
13-15 Feb. 1991
Firstpage :
114
Lastpage :
299
Keywords :
CMOS process; Circuit testing; Differential amplifiers; Random access memory; Solid state circuits; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
Type :
conf
DOI :
10.1109/ISSCC.1991.689087
Filename :
689087
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3123625
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