DocumentCode :
3123894
Title :
Model order reduction for scanning electrochemical microscope: the treatment of nonzero initial condition
Author :
Feng, Lihong ; Koziol, Darius ; Rudnyi, Evgenii B. ; Korvink, Jan G.
Author_Institution :
Microelectron. Dept., Fudan Univ., Shanghai, China
fYear :
2004
fDate :
24-27 Oct. 2004
Firstpage :
1236
Abstract :
At the present time, model order reduction is a well-established technique for fast simulation of large-scale models based on ordinary differential equations, especially those in the field of integrated circuits and micro-electromechanical systems. We describe the application of model reduction to electrochemical simulation related to scanning electrochemical microscopy. Model reduction allows us to reduce the simulation time significantly and, at the same time, it maintains the high accuracy.
Keywords :
differential equations; electrochemical sensors; microsensors; reduced order systems; scanning probe microscopy; simulation; electrochemical simulation; large-scale models; micro-electromechanical systems; model order reduction; nonzero initial condition; ordinary differential equations; scanning electrochemical microscope; scanning electrochemical microscopy; Circuit simulation; Computational modeling; Computer simulation; Differential equations; Integrated circuit modeling; Microelectromechanical systems; Microscopy; Numerical simulation; Partial differential equations; Reduced order systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2004. Proceedings of IEEE
Print_ISBN :
0-7803-8692-2
Type :
conf
DOI :
10.1109/ICSENS.2004.1426403
Filename :
1426403
Link To Document :
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