Title :
Conference Record. IEEE Instrumentation and Measurement Technology Conference (Cat. No.90CH2735-9)
Abstract :
Presents the cover from the proceedings of this conference.
Keywords :
automatic test equipment; automatic testing; calibration; computerised instrumentation; computerised signal processing; data acquisition; detectors; electric noise measurement; electronic equipment testing; instrumentation; measurement standards; microwave measurement; robots; wave analysers; waveform analysis; SQUID; automatic test systems; data acquisition; high temperature superconductors; measurement techniques; metrology; microwave measurement; noise measurements; optical measurements; pulse standards; robotic sensor; signal analysis; signal processing; superconductivity; supportability; waveform measurements; waveform recorder testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Conference_Location :
San Jose, CA, USA
DOI :
10.1109/IMTC.1990.66045
