DocumentCode :
3124938
Title :
Noise Cancellation Model Validation for Reduced Motion Artifact Wearable PPG Sensors Using MEMS Accelerometers
Author :
Wood, Levi B. ; Asada, H. Harry
Author_Institution :
Dept. of Mech. Eng., Massachusetts Inst. of Technol., Cambridge, MA
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
3525
Lastpage :
3528
Abstract :
This paper investigates the validity of utilizing Widrow´s Active Noise Cancellation (ANC) in the context of motion artifact reduction for photoplethysmogram (PPG) sensors. The ANC approach has previously been applied to the PPG problem, but little consideration has been given to the validity of the ANC signal corruption assumptions and in what motion range the algorithm works. The ANC validity testing is done in the form of impact (approximate impulse) testing of the physical PPG system and comparing with the modeled response for a range of motion amplitudes. The testing reveals that the identified corruption model does not generally represent the true physical system, but locally approximates the true system. Testing shows that if a similar motion amplitude is used for model tuning as the impact test, an average peak deviation of 5.2% is obtained, but if motion amplitude that is smaller than the impact amplitude by a factor of 5, the peak deviation is 15%. Finally, after ANC filtering motion corrupted data, heart rate can be estimated with less than 1.6% error
Keywords :
accelerometers; biomedical equipment; biosensors; microsensors; plethysmography; signal denoising; MEMS accelerometers; active noise cancellation model validation; active noise cancellation validity testing; impact testing; motion artifact reduction; signal corruption; wearable photoplethysmogram sensors; Accelerometers; Band pass filters; Biomedical monitoring; Filtering; Micromechanical devices; Motion analysis; Noise cancellation; Patient monitoring; System testing; Wearable sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260359
Filename :
4462557
Link To Document :
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