• DocumentCode
    3125112
  • Title

    Integrated design and optimization of microelectronic devices

  • Author

    Cwik, Tom ; Klimeck, Gerhard

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    5
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    131
  • Abstract
    A genetic algorithm is used for design of infrared filters and in the understanding of the material structure of a resonant tunneling diode. These two components are examples of microdevices and nanodevices that can be numerically simulated using fundamental mathematical and physical models. Because the number of parameters that can be used in the design of one of these devices is large, and because experimental exploration of the design space is unfeasible, reliable software models integrated with global optimization methods are examined. The genetic algorithm and engineering design codes have been implements on massively parallel computers to exploit their high performance. Design results are presented for the infrared filter and a resonant tunneling diode
  • Keywords
    CAD; Maxwell equations; electrical engineering computing; genetic algorithms; mesh generation; optical engineering computing; optical filters; resonant tunnelling diodes; semiconductor device models; software tools; CAD generation; Maxwell equations; electromagnetic modeling; engineering design codes; frequency selective surfaces; genetic algorithm; global optimization methods; high performance; infrared filters; integrated design and optimization; massively parallel computers; material structure; mesh generation; microelectronic devices; multi-spectral imagers; reliable software models; resonant tunneling diode; software tools; Algorithm design and analysis; Design optimization; Diodes; Filters; Genetic algorithms; Mathematical model; Microelectronics; Numerical simulation; Optimization methods; Resonant tunneling devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 1999. Proceedings. 1999 IEEE
  • Conference_Location
    Snowmass at Aspen, CO
  • Print_ISBN
    0-7803-5425-7
  • Type

    conf

  • DOI
    10.1109/AERO.1999.790196
  • Filename
    790196