• DocumentCode
    3125223
  • Title

    Measuring phase noise at K-hand

  • Author

    Key-Bolotin, Jolie A. ; Tsang, Chit-Sang

  • Author_Institution
    TRW Inc., Redondo Beach, CA, USA
  • Volume
    5
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    193
  • Abstract
    This paper investigates the applicability of common methods of phase noise measurement and short-term frequency stability measurement to K-band frequencies. A phase-noise testset was designed and implemented to test a unit with a nominal frequency of 17.86 GHz, a nominal integrated phase noise of 3° rms, and a nominal carrier-to-equivalent-noise-spectral-density of 110 dB-Hz. The object was to build the least expensive manual testset within a three month (or less) period. The testset was implemented using mostly commercial “off-the-shelf” (COTS) instruments. The oscilloscope method was only applicable to measuring instantaneous quantities of phase jitter. The frequency counter method could only be used in an automatic (computer controlled) testset. Although a stand-alone COTS phase noise measurement system was found to be the “best” measurement technique, the system offered much more capability and automation than was needed and was also fairly expensive. A second phase detector method using a superheterodyne receiver, local oscillator signal source, and root mean square voltmeter did not produce the best results; however, the results were attributable to design flaws. The method was still found to be feasible. The SSB phase noise method using a COTS spectrum analyzer was found to be very applicable to K-band testing
  • Keywords
    digital storage oscilloscopes; electric noise measurement; frequency stability; jitter; microwave measurement; phase detectors; phase noise; spectral analysers; 17.86 GHz; COTS instruments; K-band frequencies; SSB phase noise method; frequency counter method; oscilloscope method; phase detector method; phase jitter; phase noise measurement; phase-noise testset; short-term frequency stability measurement; spectrum analyzer; time jitter; Frequency measurement; Instruments; Jitter; K-band; Noise measurement; Oscilloscopes; Phase measurement; Phase noise; Stability; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 1999. Proceedings. 1999 IEEE
  • Conference_Location
    Snowmass at Aspen, CO
  • Print_ISBN
    0-7803-5425-7
  • Type

    conf

  • DOI
    10.1109/AERO.1999.790202
  • Filename
    790202