Dynamic Reliability Testing about Temperature Characteristic of Components

Author

Qiang, Gu ; Ya, Zhang ; Jinhua, Zheng

Author_Institution

Mech. & Electron. Eng. Inst., North Univ. of China, Taiyuan, China

fYear

2009

fDate

28-29 Dec. 2009

Firstpage

257

Lastpage

258

Abstract

Lacking of knowing the performance parameters of electrical products can lead to misunderstand the stability of the system. So, it is necessary that use dynamic reliability test to obtain the temperature characteristic of components of new products. Then, two important problems of this testing are selecting sensors and designing testing circuits, and dynamic testing circuit based on temperature sensor AD590 is designed in this paper, and feasibility of the schemes are tested and verified by experiment, which dynamic testing experiment is carried out to U_be of 9014AJ, receive the characteristic curve of temperature through data processing.

Keywords

design for testability; dynamic testing; electronic equipment testing; reliability; temperature sensors; thermal stability; dynamic reliability testing; dynamic testing circuit; electronic product components; temperature characteristic; temperature sensor AD590; Circuit testing; Distortion measurement; Electronic components; Electronic equipment testing; Electrons; Noise measurement; System testing; Temperature control; Temperature measurement; Temperature sensors; Dynamic testing; Electronic component; Experiment scheme; High temperature experiment; Reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless Networks and Information Systems, 2009. WNIS '09. International Conference on

Conference_Location

Shanghai

Print_ISBN

978-0-7695-3901-0

Electronic_ISBN

978-1-4244-5400-6

Type

conf

DOI

10.1109/WNIS.2009.96

Filename

5381922