Title :
Rank modulation for translocation error correction
Author :
Farnoud, Farzad ; Skachek, V. ; Milenkovic, O.
Author_Institution :
Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL, USA
Abstract :
We consider rank modulation codes for flash memories that allow for handling arbitrary charge drop errors. Unlike classical rank modulation codes used for correcting errors that manifest themselves as swaps of two adjacently ranked elements, the proposed translocation codes account for more general forms of errors that arise in storage systems. Translocations represent a natural extension of the notion of adjacent transpositions and as such may be analyzed using related concepts in combinatorics and rank modulation coding. Our results include deriving the asymptotic capacity of translocation rank codes, construction techniques for asymptotically good codes and a simple decoding algorithm.
Keywords :
decoding; error correction codes; modulation coding; adjacent transposition notion; adjacently ranked element; arbitrary charge drop error; asymptotic capacity; combinatorics coding; decoding algorithm; flash memory; storage system; translocation error correction; translocation rank modulation code; Decoding; Error correction codes; Hamming distance; Measurement; Modulation; Tin;
Conference_Titel :
Information Theory Proceedings (ISIT), 2012 IEEE International Symposium on
Conference_Location :
Cambridge, MA
Print_ISBN :
978-1-4673-2580-6
Electronic_ISBN :
2157-8095
DOI :
10.1109/ISIT.2012.6284108