• DocumentCode
    3125345
  • Title

    A configurable CMOS voltage DAC for multichannel detector systems

  • Author

    Ericson, M.N. ; Frank, S.S. ; Britton, C.L., Jr. ; Emery, M.S. ; Sam, J.S. ; Wintenberg, A.L.

  • Author_Institution
    Oak Ridge Nat. Lab., TN, USA
  • fYear
    1997
  • fDate
    9-15 Nov 1997
  • Firstpage
    671
  • Abstract
    A CMOS voltage DAC has been developed for integration into multiple front-end electronics ASICs associated with the PHENIX detector located at the RHIC accelerator of Brookhaven National Laboratory. The topology allows wide-range output programmability by selection of an offset voltage and on-chip resistor and transistor sizing. The DAC is trimless and requires no external components, making it ideal for highly integrated collider detector systems. Errors associated with on-chip bias are minimized using a topology that implements a ratiometric relationship which compensates for absolute resistance value changes and is limited only by errors in the on-chip matching of MOSFETs and resistive devices. Temperature-induced errors associated with the integrated resistors are also minimized by the circuit topology and monolithic construction. All reference voltages and currents are derived using a single regulated voltage supply. This paper presents the general DAC architecture and design method, discusses on-chip matching issues and tradeoffs associated with device sizing and monolithic layout, and presents measured performance of various gate length DACs fabricated in a 1.2 μm CMOS process including integral nonlinearity, differential nonlinearity, and slope and offset errors
  • Keywords
    CMOS integrated circuits; detector circuits; digital-analogue conversion; nuclear electronics; DAC architecture; MOSFETs; PHENIX detector; RHIC accelerator; circuit topology; configurable CMOS voltage DAC; differential nonlinearity; integral nonlinearity; integrated resistors; monolithic construction; multichannel detector systems; multiple front-end electronics ASIC; offset errors; offset voltage; on-chip bias; on-chip matching; on-chip resistor; ratiometric relationship; resistive devices; slope errors; temperature-induced errors; topology; transistor sizing; trimless DAC; wide-range output programmability; Circuit topology; Design methodology; Detectors; Electron accelerators; Laboratories; Length measurement; MOSFETs; Resistors; Size measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1997. IEEE
  • Conference_Location
    Albuquerque, NM
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-4258-5
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1997.672670
  • Filename
    672670