Yield estimation of a first-order noise-shaping D/A converter

Author

Jensen, Henrik T. ; Galton, Ian

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA

Volume

1

fYear

1997

fDate

9-12 Jun 1997

Firstpage

441

Abstract

This paper presents results that allow for a yield estimation analysis of a particular 1st-order noise-shaping digital-to-analog converter. While various dynamic element matching techniques for noise-shaping DACs have recently been proposed and their efficiency in ΔΣ data converter applications demonstrated with simulation data, no work that allows for an exact theoretical prediction of the noise-shaping performance has been published so far. As the main result of this paper, the power spectral density (PSD) of the DAC noise of a 1st-order noise-shaping DAC can be predicted and used to generate yield estimation data of the power of the signal-band DAC noise given knowledge of the statistics of the static DAC-element errors

Keywords

circuit optimisation; digital-analogue conversion; integrated circuit noise; integrated circuit yield; sigma-delta modulation; ΔΣ data converter applications; dynamic element matching techniques; first-order noise-shaping D/A converter; noise-shaping performance; power spectral density; signal-band DAC noise; static DAC-element errors; yield estimation analysis; Computational modeling; Computer architecture; Fabrication; Integrated circuit noise; Multi-stage noise shaping; Noise generators; Noise shaping; Predictive models; Signal generators; Yield estimation;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1997. ISCAS '97., Proceedings of 1997 IEEE International Symposium on

Print_ISBN

0-7803-3583-X

Type

conf

DOI

10.1109/ISCAS.1997.608762

Filename

608762