The coarticulation resistance of consonants in standard Chinese - An electropalatographic and acoustic study

The coarticulation resistance (CR) for 21 initial consonants in Standard Chinese was examined in CV monosyllables and symmetrical V1#C2V2 sequences (# stands for morpheme boundary) by analyzing the electropalatographic (EPG) and acoustic signals. The slope for F2 locus equation was compared with that for articulatory regression function, which was calculated by regressing the total linguopalatal contact ratio for vowel target frame against that for consonantal release/approach frame. The results show that the slopes derived from the articulatory regression functions for each consonant was the most appropriate measure to designate the consonant CR. When put together, the CR scale for Standard Chinese was represented by a continuum with an ascending order: labial <; velar <; alveolar <; dental, retroflex, and alveolo-palatal consonants. This consonant CR scale applied not only in the CV monosyllable set but also in V1#C2/#C2V2 transitions in V1#C2V2 sequences. The overall results of the paper support the DAC model in that the coarticulation resistance for consonants was closely dependent on the involvement of tongue dorsum gesture in segment production.