• DocumentCode
    3125910
  • Title

    Frequency Domain Analysis of Sleep EEG for Visualization and Automated State Detection

  • Author

    Vivaldi, Ennio A. ; Bassi, Alejandro

  • Author_Institution
    Laboratorio de Sueno y Cronobiologia, Univ. de Chile, Santiago
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    3740
  • Lastpage
    3743
  • Abstract
    Conventional analysis of EEG signals for sleep scoring is based on the time domain assessment of wave patterns. Human experts carry out this task relying on the direct visualization of EEG epochs. Techniques that enhance an intuitive visualization may encourage a wider use of more abstract descriptors, such as frequency domain features. This paper presents a feature extraction method for EEG signals based on FFT and principal component analysis. The result of the method is a characterization of EEG epochs with only two variables. Density plots of this 2D projection show compact clusters that correspond to sleep behavioral states. The distance to the centroid of a cluster is a reliable scoring criterion which is both easy to visualize and easy to automate. The techniques presented here have been shown to work reliably for both human and rat sleep studies
  • Keywords
    electroencephalography; fast Fourier transforms; frequency-domain analysis; medical signal detection; medical signal processing; principal component analysis; sleep; EEG epochs; FFT; automated state detection; density plots; feature extraction method; frequency domain analysis; human sleep EEG; intuitive EEG visualization; principal component analysis; rat sleep; scoring criterion; sleep behavioral states; Electroencephalography; Feature extraction; Frequency domain analysis; Humans; Pattern analysis; Principal component analysis; Signal analysis; Sleep; Time domain analysis; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259546
  • Filename
    4462612