Title :
A 180Mhz ASIC For High-speed Interfaces
Author :
Thompson, D.W. ; Gabara, T.J. ; Stroud, C.E.
Author_Institution :
AT&T Bell Laboratorie
Keywords :
Application specific integrated circuits; Backplanes; Built-in self-test; Circuit testing; Clocks; Control system synthesis; Cyclic redundancy check; Electrical fault detection; Printed circuits; Variable structure systems;
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
DOI :
10.1109/ISSCC.1991.689100
